Type of Publication: Article in Collected Edition

The BI Trap - A Tripping Risk on the Way to the Successful Use of Process Mining

Author(s):

Navratilova, Martina; Nusch, Henning; Plattfaut, Ralf; Coners, André

Editor:

Bui, Tung X.

Title of Anthology:

Proceedings of the 59th Hawaii International Conference on System Sciences

Location(s):

Honolulu, HI

Publication Date:

2026

ISBN:

9780998133195

Citation:

Download BibTeX